Ultrafast-ultrafine probing of high-speed electrical waveforms using a scanning force microscope with photoconductive gating
نویسنده
چکیده
Picosecond photoconductivity in low-temperature-grown GaAs (LT GaAs) has been used to provide temporal resolution both in rigid probes and in scanning force microscope probes. This article reviews the fabrication and use of such probes. 2.5 ps temporal resolution and few microvolts sensitivity are obtained at arbitrary points on circuits with a spatial definition of 100 nm. Rigid probes are tested in application to analogue and digital circuits. As an alternative to electron beam testing, scanning force probes are applied to in situ imaging and waveform measurement. Finally, the use of time-resolved waveform analysis with scanning-force microscopy probes with semiconductor laser sources is demonstrated.
منابع مشابه
Fabrication of Biodegradable PCL Particles as well as PA66 Nanofibers via Air-Sealed Centrifuge Electrospinning (ASCES)
This study presents a method for fabrication of ultrafine polymeric nanofibers as well as nano/micro particles utilizing centrifugal and electrostatic forces simultaneously. To reduce the diameter and variety of nanofibers produced from solid state polymerized PA66, a unique electrocentrifuge spinning device was utilized with a rotating nozzle and collector, while the fabrication process (spinn...
متن کاملEqual Channel Angular Pressing to Produce Ultrafine Pure Copper with Excellent Electrical and Mechanical Properties
In this article, commercially pure copper samples were severely deformed by equal channel angular pressing (ECAP) up to eight passes at room temperature. The effects of severe plastic deformation on the microstructure, mechanical properties, and electrical conductivity of the copper were investigated. The microstructure evolution was followed by optical microscope and field emission scanning el...
متن کاملBreaking the Time Barrier in Kelvin Probe Force Microscopy: Fast Free Force Reconstruction Using the G-Mode Platform.
Atomic force microscopy (AFM) offers unparalleled insight into structure and material functionality across nanometer length scales. However, the spatial resolution afforded by the AFM tip is counterpoised by slow detection speeds compared to other common microscopy techniques (e.g., optical, scanning electron microscopy, etc.). In this work, we develop an ultrafast AFM imaging approach allowing...
متن کاملHigh-speed Serial-kinematic Spm Scanner: Design and Drive Considerations
This paper describes the design of a flexure-guided, two-axis nanopositioner (scanner) driven by piezoelectric stack actuators. The scanner is specifically designed for high-speed scanning probe microscopy (SPM) applications, such as atomic force microscopy (AFM). A high-speed AFM scanner is an essential component for acquiring high-resolution, three-dimensional, time-lapse images of fast proce...
متن کاملIn-Plane AFM Probe with Tunable stiffness
We developed an in-plane Atomic Force Microscope (AFM) probe that is specifically tailored to the needs of biological applications. It features a variable stiffness, which makes the stiffness of the probe adjustable to the surface hardness of the sample [1]. The inherent capability of the in-plane AFM probe for building a massively parallel array is also an important feature that greatly affect...
متن کامل